ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1991

• : soft.
• : case.
• : micro.

タイトル別名

Proceedings of the 1991 International Conference on Microelectronic Test Structures

91CH29074

注記

Includes bibliographical references and index

"90CH2907-4."

詳細情報

• NII書誌ID(NCID): BA12891036
• ISBN:
  • 0879425881
  • 087942589X
  • 0879425903
• LCCN: 90082543
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY
• ページ数/冊数: xii, 264 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses