Diagnostic measurements in LSI/VLSI integrated circuits production
著者
書誌事項
Diagnostic measurements in LSI/VLSI integrated circuits production
（Advanced series in electrical and computer engineering, vol. 7）
World Scientific, 1991
大学図書館所蔵 件 / 全7件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
内容説明・目次
内容説明
This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.
「Nielsen BookData」 より
