Diagnostic measurements in LSI/VLSI integrated circuits production

Author(s)

• Jakubowski, Andrzej
• Marciniak, Wiesław
• Przewłocki, Henryk M.

Bibliographic Information

Diagnostic measurements in LSI/VLSI integrated circuits production

Andrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki

（Advanced series in electrical and computer engineering, vol. 7）

World Scientific, 1991

Details

• NCID: BA12908740
• ISBN:
  • 9810202822
• LCCN: 91003700
• Country Code: si
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Singapore ; Teaneck, N.J.
• Pages/Volumes: xv, 356 p.
• Size: 23 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
• Parent Bibliography ID:
  • BA07409286