Neural models and algorithms for digital testing

Author(s)

• Chakradhar, Srimat T.
• Agrawal, Vishwani D.
• Bushnell, Michael L. (Michael Lee)

Bibliographic Information

Neural models and algorithms for digital testing

by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

（The Kluwer international series in engineering and computer science, SECS 140 . VLSI, computer architecture and digital signal processing）

Kluwer Academic Publishers, c1991

• : acid-free paper

Note

Includes bibliographical references and index

Details

• NCID: BA12943049
• ISBN:
  • 0792391659
• LCCN: 91015225
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xii, 184 p.
• Size: 25 cm
• Classification:
  • LCC : TK7868.L6
  • DC20 : 621.39/5
• Subject Headings:
  • LCSH : Logic circuits -- Testing
  • LCSH : Automatic checkout equipment
  • LCSH : Digital integrated circuits -- Testing -- Data processing
• Parent Bibliography ID:
  • BA0004729X