Neural models and algorithms for digital testing

著者

• Chakradhar, Srimat T.
• Agrawal, Vishwani D.
• Bushnell, Michael L. (Michael Lee)

書誌事項

Neural models and algorithms for digital testing

by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

（The Kluwer international series in engineering and computer science, SECS 140 . VLSI, computer architecture and digital signal processing）

Kluwer Academic Publishers, c1991

• : acid-free paper

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA12943049
• ISBN:
  • 0792391659
• LCCN: 91015225
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xii, 184 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7868.L6
  • DC20 : 621.39/5
• 件名:
  • LCSH : Logic circuits -- Testing
  • LCSH : Automatic checkout equipment
  • LCSH : Digital integrated circuits -- Testing -- Data processing
• 親書誌ID:
  • BA0004729X