{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA13141202.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA13141202#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA13141202.json"},"dc:title":[{"@value":"Electrical spectrum and network analyzers : a practical approach"}],"dc:creator":"Albert D. Helfrick","dc:publisher":[{"@value":"Academic Press"}],"dcterms:extent":"ix, 212 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1991","cinii:ncid":"BA13141202","cinii:ownerCount":"8","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA00036981#entity","@type":"foaf:Person","foaf:name":[{"@value":"Helfrick, Albert D."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001415","@type":"foaf:Organization","foaf:name":"東北大学 附属図書館 工学分館","rdfs:seeAlso":{"@id":"https://opac.library.tohoku.ac.jp/opac/opac_openurl/?ncid=BA13141202"}},{"@id":"https://ci.nii.ac.jp/library/FA002542","@type":"foaf:Organization","foaf:name":"名古屋工業大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.nitech.ac.jp/opc/recordID/catalog.bib/BA13141202"}},{"@id":"https://ci.nii.ac.jp/library/FA005686","@type":"foaf:Organization","foaf:name":"中央大学 図書館 理工学部分館","rdfs:seeAlso":{"@id":"https://opac.library.chuo-u.ac.jp/"}},{"@id":"https://ci.nii.ac.jp/library/FA006339","@type":"foaf:Organization","foaf:name":"日本大学 工学部図書館","rdfs:seeAlso":{"@id":"https://celib.nihon-u.ac.jp/opac/opac_openurl/?ncid=BA13141202"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA13141202"}},{"@id":"https://ci.nii.ac.jp/library/FA007739","@type":"foaf:Organization","foaf:name":"立命館大学 図書館","rdfs:seeAlso":{"@id":"http://runners.ritsumei.ac.jp/opac/opac_openurl/?ncid=BA13141202"}},{"@id":"https://ci.nii.ac.jp/library/FA020001","@type":"foaf:Organization","foaf:name":"大阪工業大学 図書館 枚方分館"},{"@id":"https://ci.nii.ac.jp/library/FA021864","@type":"foaf:Organization","foaf:name":"山陽小野田市立山口東京理科大学 図書館","rdfs:seeAlso":{"@id":"https://library.socu.ac.jp/opac/search?autoDetail=true&searchmode=complex&target=local&s_ncid=BA13141202"}}],"bibo:lccn":["90049831"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/90049831"}],"prism:publicationDate":["c1991"],"cinii:note":["Includes bibliographical references (p. 207-208) and index"],"dc:subject":["LCC:TK7879.4","DC20:621.382"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Spectrum+analysis","dc:title":"Spectrum analysis"},{"@id":"https://ci.nii.ac.jp/books/search?q=Spectrum+analyzers","dc:title":"Spectrum analyzers"}],"dcterms:hasPart":[{"@id":"urn:isbn:0123382505"}]}]}