Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida

著者

• Jain, Ravi
• Society of Photo-optical Instrumentation Engineers
• Metallurgical Society (U.S.)

書誌事項

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida

Ravi Jain, editor ; sponsored by SPIE--the International Societyfor Optical Engineering ; cooperating sponsor, the Metallurgical Society

（Critical reviews of optical science and technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 795）

SPIE, c1987

注記

Includes bibliographies and index

• NII書誌ID(NCID): BA13194129
• ISBN:
  • 0892528303
• LCCN: 87061008
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: x, 359 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Very high speed integrated circuits -- Congresses
  • LCSH : Semiconductors -- Congresses
• 親書誌ID:
  • BA07938028
  • BA0022700X