Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida

Author(s)

• Jain, Ravi
• Society of Photo-optical Instrumentation Engineers
• Metallurgical Society (U.S.)

Bibliographic Information

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida

Ravi Jain, editor ; sponsored by SPIE--the International Societyfor Optical Engineering ; cooperating sponsor, the Metallurgical Society

（Critical reviews of optical science and technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 795）

SPIE, c1987

Note

Includes bibliographies and index

• NCID: BA13194129
• ISBN:
  • 0892528303
• LCCN: 87061008
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: x, 359 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/5
• Subject Headings:
  • LCSH : Very high speed integrated circuits -- Congresses
  • LCSH : Semiconductors -- Congresses
• Parent Bibliography ID:
  • BA07938028
  • BA0022700X