Electron and ion microscopy and microanalysis : principles and applications
Author(s)
Bibliographic Information
Electron and ion microscopy and microanalysis : principles and applications
（Optical engineering, v. 29）
M. Dekker, c1991
2nd ed., rev. and expanded
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Note
Includes bibliographical references and indexes
Description and Table of Contents
Description
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Table of Contents
CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.
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