Electron and ion microscopy and microanalysis : principles and applications
著者
書誌事項
Electron and ion microscopy and microanalysis : principles and applications
（Optical engineering, v. 29）
M. Dekker, c1991
2nd ed., rev. and expanded
大学図書館所蔵 件 / 全9件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and indexes
内容説明・目次
内容説明
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
目次
CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.
「Nielsen BookData」 より