Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991

Author(s)

• Cullis, A. G.
• Long, N. J.
• Institute of Physics (Great Britain). Electron Microscopy and Analysis Group
• Royal Microscopical Society (Great Britain)
• Materials Research Society

Bibliographic Information

Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991

edited by A.G. Cullis and N.J. Long

（Institute of Physics conference series, no. 117）

Institute of Physics, c1991

Note

Sponsored by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society, and the Materials Research Society

Includes bibliographical references and indexes

Details

• NCID: BA13491292
• ISBN:
  • 0854984062
• LCCN: 91036083
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bristol ; New York
• Pages/Volumes: xix, 801 p.
• Size: ill. ; 24 cm
• Classification:
  • LCC : QC610.9
  • DC20 : 620.1/12972
• Subject Headings:
  • LCSH : Semiconductors -- Congresses
  • LCSH : Electron microscopy -- Congresses
  • LCSH : Materials -- Microscopy -- Congresses
  • LCSH : Epitaxy -- Congresses
  • LCSH : Silicon crystals -- Congresses
• Parent Bibliography ID:
  • BA00171324