Testing semiconductor memories : theory and practice

Author(s)

• Goor, A. J. van de.

Bibliographic Information

Testing semiconductor memories : theory and practice

A.J. van de Goor

J. Wiley & Sons, 1991

• disk

Note

Includes bibliographical references and index

Details

• NCID: BA13559501
• ISBN:
  • 0471925861
  • 047192587X
• LCCN: 91020658
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chichester ; New York
• Pages/Volumes: xxiii, 512 p.
• Size: 24 cm
• Classification:
  • LCC : TK7895.M4
  • DC20 : 621.381/52
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing