Analysis of microelectronic materials and devices

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Bibliographic Information

Analysis of microelectronic materials and devices

edited by M. Grasserbauer and H.W. Werner

Wiley, c1991

Available at  / 13 libraries

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Note

Includes bibliographical references and index

Description and Table of Contents

Volume

ISBN 9780471917137

Description

Presents a comprehensive survey of analytical techniques currently used in support of all stages of microelectronic materials and device processing. The diversity of topics covered has been achieved by bringing together an international field of authors contributing specialized chapters.
Volume

ISBN 9780471950134

Description

This book presents, for the first time, a comprehensive survey ofanalytical techniques currently used in support of all stages ofmicroelectronic materials and device processing. The diversity oftopics covered in this book has been achieved by bringing togetheran international field of authors contributing specializedindividual chapters. This has ensured that each technique isdiscussed in detail giving in-depth treatments of the subjectmatter. A particularly helpful feature in this book is the concisetechnical summary given at the end of each section. Four majorareas are considered in this volume: * Bulk analysis of microelectronic materials * Analysis of surfaces, interfaces and thin films * Structure analysis on an atomic scale * Characterization of physical, electrical and topographicfeatures Complete with over 400 illustrations, this volume is anindispensible guide to analytical support for the microelectronicindustry.

Table of Contents

Bulk Analysis of Microelectronic Materials. Analysis of Surfaces, Interfaces and Thin Films. Structure Analysis on an Atomic Scale. Physical, Electrical and Geometrical Characterization. Index.

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