Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications

著者

• Rathore, Hazara S.
• Mathad, G. S.
• Nguyen, Du B.
• Electrochemical Society. Dielectric Science and Technology Division
• Electrochemical Society. Electronics Division

書誌事項

Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications

edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen ; Dielectric Science & Technology and Electronics Divisions

（Proceedings / [Electrochemical Society], v. 92-4）

Dielectric Science & Technology, and Electronics Divisions, Electrochemical Society, c1992

詳細情報

• NII書誌ID(NCID): BA14411619
• ISBN:
  • 1566770033
• LCCN: 92070488
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: viii, 330 p.
• 親書誌ID:
  • BA01323290