International conference on wafer scale integration : proceedings, San Francisco, California, USA

著者

• International Conference on Wafer Scale Integration
• IEEE Computer Society
• IEEE Components, Hybrids, and Manufacturing Technology Society
• Jain, Vijay K.
• Wyatt, Peter W.

書誌事項

International conference on wafer scale integration : proceedings, San Francisco, California, USA

sponosreseored by IEEE Computer Society, IEEE Components, Hybrids, and Manufacuturing Technology Society ; edited by Vijay K. Jain and Peter W. Wyatt

IEEE Computer Society Press, 1992

• : case
• : micro

タイトル別名

92CH30882

注記

"IEEE catalog number 92CH3088-2."

Includes index

詳細情報

• NII書誌ID(NCID): BA17242835
• ISBN:
  • 0818624825
  • 0818624817
• LCCN: 91075442
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: 363 p.
• 大きさ: 24 cm