The spectroscopy of semiconductors
Author(s)
Bibliographic Information
The spectroscopy of semiconductors
（Semiconductors and semimetals, v. 36）
Academic Press, c1992
Available at / 48 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
428.41:S13:367210047499
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Institute of Materials and Systems for Sustainability, Nagoya University未来材料研
428.8||Se41073139
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.
Table of Contents
- Laser spectroscopy of semiconductors at low temperatures and high magnetic fields, D. Heiman
- transient spectroscopy by ultrashort laser pulse techniques, A.V. Nurmikko
- piezospectroscopy of semiconductors, A.K. Ramdas and S. Rodriguez
- photoreflectance spectroscpoy of microstructures, O.J. Glembocki and B.V. Shanabrook
- one- and two-photon magneto-optical spectroscopy of InSb and Hg(1-x)Cd(x)Te, D.G. Seiler, et al.
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