Proceedings of the Transistor Reliability Symposium, September 17 and 18, 1956

著者

• U. S. Advisory Group on Electron Tubes.
• Transistor Reliability Symposium
• United States. Office of Assistant Secretary of Defense (Research and Engineering)

書誌事項

Proceedings of the Transistor Reliability Symposium, September 17 and 18, 1956

sponsored by the Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes, Office of the Assistant Secretary of Defense, Research and Engineering

New York University Press, 1958

詳細情報

• NII書誌ID(NCID): BA17410973
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 128 p.
• 大きさ: 23 cm