Dislocations and interfaces in semiconductors

著者

• Rajan, Krishna
• Narayan, J. (Jaydish)
• Ast, D. G. (Dieter G.)
• Metallurgical Society (U.S.). Meeting
• TMS Electronic Device Materials Committee

書誌事項

Dislocations and interfaces in semiconductors

edited by Krishna Rajan, J. Narayan, Dieter G. Ast

Metallurgical Society, c1988

注記

"Proceedings of a symposium 'Dislocations and Interfaces in Semiconductors' sponsored by the Electronic Device Materials Committee of TMS, held at the 1988 TMS Annual Meeting, Phoenix, Arizona, January 25-26, 1988."

Includes bibliographical references and indexes

内容説明・目次

内容説明

Proceedings of a symposium held during the Society's annual meeting in Arizona in January, 1988. Thirty papers provide a coordinated materials science perspective of interfaces in semiconductors, with particular emphais on the role of defects at these interfaces. Includes experimental and theoretica

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詳細情報

• NII書誌ID(NCID): BA18208355
• ISBN:
  • 0873390466
• LCCN: 88061505
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa.
• ページ数/冊数: viii, 199 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC611.6.D4
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses