Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

著者

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Brozel, M. R. (Michael R.)
• Stirland, D. J. (Derek J.)

書誌事項

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

edited by M.R. Brozel, D.J. Stirlnd

Adam Hilger, 1992

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA18215463
• ISBN:
  • 0750301880
• LCCN: 92006513
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 310 p.
• 大きさ: 31 cm
• 分類:
  • LCC : TK7871.85
  • DC20 : 621.3815/2/0287
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Photoluminescence -- Congresses
  • LCSH : Gallium arsenide semiconductors -- Congresses