Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

Author(s)

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Brozel, M. R. (Michael R.)
• Stirland, D. J. (Derek J.)

Bibliographic Information

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

edited by M.R. Brozel, D.J. Stirlnd

Adam Hilger, 1992

Note

Includes bibliographical references

Details

• NCID: BA18215463
• ISBN:
  • 0750301880
• LCCN: 92006513
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: 310 p.
• Size: 31 cm
• Classification:
  • LCC : TK7871.85
  • DC20 : 621.3815/2/0287
• Subject Headings:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Photoluminescence -- Congresses
  • LCSH : Gallium arsenide semiconductors -- Congresses