{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA18260956.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA18260956#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA18260956.json"},"dc:title":[{"@value":"ICMTS 92 : proceedings of the 1992 International Conference on Microelectronic Test Structures : March 16-19, 1992, San Diego, California"}],"dcterms:alternative":["1992 IEEE International Conference on Microelectronic Test Structures","92CH31021"],"dc:creator":"sponsored by the IEEE Electron Devices Society","dc:publisher":[{"@value":"Institute of Electrical and Electronics Engineers"}],"dcterms:extent":"xi, 214 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1991","cinii:ncid":"BA18260956","cinii:ownerCount":"3","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03840992#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE International Conference on Microelectronic Test Structures"}]},{"@id":"https://ci.nii.ac.jp/author/DA01257512#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Electron Devices Society"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA18260956"}},{"@id":"https://ci.nii.ac.jp/library/FA005358","@type":"foaf:Organization","foaf:name":"上智大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.sophia.ac.jp/opac/opac_openurl?ncid=BA18260956"}},{"@id":"https://ci.nii.ac.jp/library/FA005802","@type":"foaf:Organization","foaf:name":"東海大学 付属図書館","rdfs:seeAlso":{"@id":"https://opac-t.time.u-tokai.ac.jp/iwjs0018opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA18260956"}}],"bibo:lccn":["91077920"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/91077920"}],"prism:publicationDate":["c1991"],"cinii:note":["Includes bibliographical references and index","\"92CH3102-1.\""],"dc:subject":["LCC:TK7874","DC20:621.381/5"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Testing+--+Congresses","dc:title":"Integrated circuits -- Testing -- Congresses"}],"dcterms:hasPart":[{"@id":"urn:isbn:0780305353","dc:title":": soft."},{"@id":"urn:isbn:0780305361","dc:title":": case."},{"@id":"urn:isbn:078030537X","dc:title":": micro."}]}]}