Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

Bibliographic Information

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

editors: C.V. Thompson, J.R. Lloyd

(Materials Research Society symposium proceedings, v. 265)

Materials Research Society, c1992

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Includes bibliographical references and index

Description and Table of Contents

Description

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

by "Nielsen BookData"

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