{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA18925844.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA18925844#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA18925844.json"},"dc:title":[{"@value":"Vision '90 : conference proceedings, November 12-15, 1990, Detroit, Michigan"}],"dcterms:alternative":["Vision ninety"],"dc:creator":"sponsored by the Machine Vision Association of the Society of Manufacturing Engineers","dc:publisher":[{"@value":"Society of Manufacturing Engineers"}],"dcterms:extent":"1 v. (various pagings)","cinii:size":"28 cm","dc:language":"und","dc:date":"1990","cinii:ncid":"BA18925844","cinii:ownerCount":"2","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA06873885#entity","@type":"foaf:Person","foaf:name":[{"@value":"Vision"}]},{"@id":"https://ci.nii.ac.jp/author/DA0187851X#entity","@type":"foaf:Person","foaf:name":[{"@value":"Machine Vision Association of SME"}]},{"@id":"https://ci.nii.ac.jp/author/DA0007772X#entity","@type":"foaf:Person","foaf:name":[{"@value":"Society of Manufacturing Engineers"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA022120","@type":"foaf:Organization","foaf:name":"京都大学 桂図書館","rdfs:seeAlso":{"@id":"https://kuline.kulib.kyoto-u.ac.jp/opac/opac_openurl/?ncid=BA18925844"}},{"@id":"https://ci.nii.ac.jp/library/FA005642","@type":"foaf:Organization","foaf:name":"拓殖大学 八王子図書館","rdfs:seeAlso":{"@id":"https://opac.lib.takushoku-u.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA18925844"}}],"bibo:lccn":["90061669"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/90061669"}],"prism:publicationDate":["c1990"],"cinii:note":["Includes bibliographical references"],"dc:subject":["LCC:TS156.2","DC20:658.5/62"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Quality+control+--+Optical+methods+--+Automation+--+Congresses","dc:title":"Quality control -- Optical methods -- Automation -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Computer+vision+--+Industrial+applications+--+Congresses","dc:title":"Computer vision -- Industrial applications -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Engineering+inspection+--+Automation+--+Congresses","dc:title":"Engineering inspection -- Automation -- Congresses"}],"dcterms:hasPart":[{"@id":"urn:isbn:0872633918"}]}]}