IEEE recommended practice for latchup test methods for CMOS and BiCMOS integrated-circuit prosess characterization

Author(s)

• Institute of Electrical and Electronics Engineers
• IEEE Electron Devices Society. Latchup Committee
• IEEE Standards Board

Bibliographic Information

IEEE recommended practice for latchup test methods for CMOS and BiCMOS integrated-circuit prosess characterization

sponsor, Latchup Committee of the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, 1991

Note

"IEEE std 1181-1991"

Details

• NCID: BA18935473
• ISBN:
  • 1559371528
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y., USA
• Pages/Volumes: 36 p.
• Size: 28 cm