Proceedings : Fiftieth annual meeting : Electron Microscopy Society of America, Twenty-seventh annual meeting : Microbeam Analysis Society, Nineteenth Annual meeting : Microscopical Society of Canada/Societe de Microscopie du Canada, Boston, Massachusetts, 16-21 August 1992

Author(s)

• Electron Microscopy Society of America
• Bailey, G. W.
• Bentley, J.
• Small, J. A.
• Annual Meeting Electron Microscopy Society of America

Bibliographic Information

Proceedings : Fiftieth annual meeting : Electron Microscopy Society of America, Twenty-seventh annual meeting : Microbeam Analysis Society, Nineteenth Annual meeting : Microscopical Society of Canada/Societe de Microscopie du Canada, Boston, Massachusetts, 16-21 August 1992

editors, G.W. Bailey, J. Bentley, J.A. Small

San Francisco Press, 1992

• PART I
• PART II

Other Title

Electron Microscopy

Note

Includes index

Details

• NCID: BA18973042
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: San Francisco, Calif.
• Pages/Volumes: 2 v. (lv, 1789 p.)
• Size: 26 cm