Proceedings : Fiftieth annual meeting : Electron Microscopy Society of America, Twenty-seventh annual meeting : Microbeam Analysis Society, Nineteenth Annual meeting : Microscopical Society of Canada/Societe de Microscopie du Canada, Boston, Massachusetts, 16-21 August 1992

著者

• Electron Microscopy Society of America
• Bailey, G. W.
• Bentley, J.
• Small, J. A.
• Annual Meeting Electron Microscopy Society of America

書誌事項

Proceedings : Fiftieth annual meeting : Electron Microscopy Society of America, Twenty-seventh annual meeting : Microbeam Analysis Society, Nineteenth Annual meeting : Microscopical Society of Canada/Societe de Microscopie du Canada, Boston, Massachusetts, 16-21 August 1992

editors, G.W. Bailey, J. Bentley, J.A. Small

San Francisco Press, 1992

• PART I
• PART II

タイトル別名

Electron Microscopy

注記

Includes index

詳細情報

• NII書誌ID(NCID): BA18973042
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: San Francisco, Calif.
• ページ数/冊数: 2 v. (lv, 1789 p.)
• 大きさ: 26 cm