Proceedings : International Test Conference 1992

著者

• International Test Conference

書誌事項

Proceedings : International Test Conference 1992

[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]

International Test Conference, c1992

• : soft.
• : case.
• : micro.

タイトル別名

ITC : International Test Conference 1992

1992 IEEE International Test Conference

Discover the new world of test and design

92CH31914

注記

At head of title: ITC : International Test Conference 1992

"September 20-24, 1992, Convention Center, Baltimore, MD, USA"--Cover

"IEEE Catalog Number 92-CH3191-4."--T.p. verso

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA19138856
• ISBN:
  • 0818631678
  • 0780307607
  • 081863166X
• LCCN: 92073585
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Altoona, PA
• ページ数/冊数: xii, 1012 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses