Testability of electronic circuits
著者
書誌事項
Testability of electronic circuits
C. Hanser , Prentice Hall, c1991
- タイトル別名
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Prüfbarkeit elektronischer Schaltungen
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注記
Translation of: Prüfbarkeit elektronischer Schaltungen
Includes bibliographical references and index
内容説明・目次
内容説明
Recognizing the increasing complexity of electronic components, this comprehensive book presents a complete overview of the technology and economics of building testability into the design of electronic circuits. Offering background techniques and practical applications for the design of testability in digital, analog and hybrid circuits, the text exposes the problems in testing electronic circuits during manufacturing and maintenance; offers practical examples and current techniques for circuit design that includes testability; describes both hardware and software technologies used in automatic testing and places heavy emphasis on computer aided testing technology and its relation to computer aided design.
目次
- Basics and development of electrical measurement and testing technology
- technological and economic importance of testability in testing procedures
- failure types, failure causes and failure frequencies
- partitioning of electronic products
- test points
- structured design
- built in test
- testability problems in LSI and VLSI circuits
- guidelines for the development of analog circuits
- "Design for testablity" for hybrid building blocks
- generation of programmes for digital test objects
- CAE, CAM, CAD, CAT and CAR in combination
- design for testability - the necessary link between, design and testing. Appendices: steps for improving the testability fo electronic circuits (checklist)
- the most important circuits and their test points
- characteristic advantages and disadvantages of various technologies.
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