Autotestcon '87 : proceedings : Nobember 3-5, 1987, IEEE International Automatic Testing Conference, Moscone Convention Center, San Francisco

Author(s)

• Autotestcon
• Institute of Electrical and Electronics Engineers

Bibliographic Information

Autotestcon '87 : proceedings : Nobember 3-5, 1987, IEEE International Automatic Testing Conference, Moscone Convention Center, San Francisco

sponsored by, the Institute of Electrical and Electronics Engineers ... [et al.]

IEEE, c1987

Other Title

Autotestcon 1987 Symposium Proceedings

Bridging standards to advancing technology

Proceedings of IEEE International Automatic Testing Conference, San Francisco, CA, Nobember 3-5, 1987

87CH2510-6

87CH25106

Note

"87CH2510-6."

"Bridging standards to advancing technology"

"Autotescon '87, the 23rd annual Automatic Testing Conference"--p. iii

Includes bibliographies

Details

• NCID: BA19385560
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: xvii, 494 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Automatic checkout equipment -- Congresses