Autotestcon '87 : proceedings : Nobember 3-5, 1987, IEEE International Automatic Testing Conference, Moscone Convention Center, San Francisco

著者

• Autotestcon
• Institute of Electrical and Electronics Engineers

書誌事項

Autotestcon '87 : proceedings : Nobember 3-5, 1987, IEEE International Automatic Testing Conference, Moscone Convention Center, San Francisco

sponsored by, the Institute of Electrical and Electronics Engineers ... [et al.]

IEEE, c1987

タイトル別名

Autotestcon 1987 Symposium Proceedings

Bridging standards to advancing technology

Proceedings of IEEE International Automatic Testing Conference, San Francisco, CA, Nobember 3-5, 1987

87CH2510-6

87CH25106

注記

"87CH2510-6."

"Bridging standards to advancing technology"

"Autotescon '87, the 23rd annual Automatic Testing Conference"--p. iii

Includes bibliographies

詳細情報

• NII書誌ID(NCID): BA19385560
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xvii, 494 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses