{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA1952825X.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA1952825X#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA1952825X.json"},"dc:title":[{"@value":"Semiconductor measurements and instrumentation"}],"dc:creator":"W. R. Runyan","dc:publisher":[{"@value":"McGraw-Hill"}],"dcterms:extent":"vii, 280 p.","cinii:size":"26 cm","dc:language":"eng","dc:date":"1975","cinii:ncid":"BA1952825X","prism:edition":"International student edition","cinii:ownerCount":"21","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA04113530#entity","@type":"foaf:Person","foaf:name":[{"@value":"Runyan, W. R."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001492","@type":"foaf:Organization","foaf:name":"東北大学 電気通信研究所 図書室","rdfs:seeAlso":{"@id":"http://opac.library.tohoku.ac.jp/opac/opac_openurl/?ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA001652","@type":"foaf:Organization","foaf:name":"筑波大学 附属図書館 中央図書館","rdfs:seeAlso":{"@id":"https://www.tulips.tsukuba.ac.jp/mylimedio/search/search.do?target=local&mode=comp&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA001732","@type":"foaf:Organization","foaf:name":"群馬大学 総合情報メディアセンター 理工学図書館","rdfs:seeAlso":{"@id":"http://opac.lib.gunma-u.ac.jp/opc/recordID/catalog.bib/BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA001743","@type":"foaf:Organization","foaf:name":"埼玉大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.saitama-u.ac.jp/Main/OpenSearch?ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA011791","@type":"foaf:Organization","foaf:name":"東京大学 工学部・工学系研究科","rdfs:seeAlso":{"@id":"https://opac.dl.itc.u-tokyo.ac.jp/opac/opac_openurl/?ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA001991","@type":"foaf:Organization","foaf:name":"電気通信大学 附属図書館","rdfs:seeAlso":{"@id":"https://www.lib.uec.ac.jp/mylimedio/search/search.do?mode=comp&taget=local&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA002087","@type":"foaf:Organization","foaf:name":"新潟大学 附属図書館","rdfs:seeAlso":{"@id":"http://opac.lib.niigata-u.ac.jp/opc/recordID/catalog.bib/BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA002382","@type":"foaf:Organization","foaf:name":"静岡大学 附属図書館 浜松分館","rdfs:seeAlso":{"@id":"https://uni.lib.shizuoka.ac.jp/sul/resolver/svc_dat=suopac/rfr_id=https%3A%2F%2Fnii.ac.jp/?pid=ncid%3ABA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA002542","@type":"foaf:Organization","foaf:name":"名古屋工業大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.nitech.ac.jp/opc/recordID/catalog.bib/BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA002564","@type":"foaf:Organization","foaf:name":"三重大学 附属図書館","rdfs:seeAlso":{"@id":"http://opac.lib.mie-u.ac.jp/opc/xc/openurl/search?rft.issn=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA003476","@type":"foaf:Organization","foaf:name":"九州大学 芸術工学図書館","rdfs:seeAlso":{"@id":"https://catalog.lib.kyushu-u.ac.jp/opac_openurl/?ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA003501","@type":"foaf:Organization","foaf:name":"佐賀大学 附属図書館 医学分館","rdfs:seeAlso":{"@id":"http://opac.lib.saga-u.ac.jp/opc/recordID/catalog.bib/BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA014053","@type":"foaf:Organization","foaf:name":"東京都立大学 図書館 日野館","rdfs:seeAlso":{"@id":"https://opactmu.lib.tmu.ac.jp/iwjs0013opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA004934","@type":"foaf:Organization","foaf:name":"青山学院大学 万代記念図書館(相模原分館)","rdfs:seeAlso":{"@id":"https://opac.agulin.aoyama.ac.jp/iwjs0011opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA005019","@type":"foaf:Organization","foaf:name":"学習院大学 図書館","rdfs:seeAlso":{"@id":"https://glim-op.glim.gakushuin.ac.jp/webopac/cattab.do?sp_srh_flg=true&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA007251","@type":"foaf:Organization","foaf:name":"愛知工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.aitech.ac.jp/iwjs0007opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA007852","@type":"foaf:Organization","foaf:name":"大阪産業大学 綜合図書館","rdfs:seeAlso":{"@id":"https://library.cnt.osaka-sandai.ac.jp/gate?module=search&path=search&method=search&searchForm.library=true&searchForm.orderNumber=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA007965","@type":"foaf:Organization","foaf:name":"関西大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.kansai-u.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA1952825X"}},{"@id":"https://ci.nii.ac.jp/library/FA015271","@type":"foaf:Organization","foaf:name":"東京工業高等専門学校 図書館"},{"@id":"https://ci.nii.ac.jp/library/FA01630X","@type":"foaf:Organization","foaf:name":"大分工業高等専門学校 図書館"},{"@id":"https://ci.nii.ac.jp/library/FA016310","@type":"foaf:Organization","foaf:name":"独立行政法人国立高等専門学校機構 香川高等専門学校 高松キャンパス 図書館"}],"bibo:lccn":["75019035"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/75019035"}],"prism:publicationDate":["[1975]"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:QC611.24","DC:537.6/22"],"cinii:relation":[{"@id":"https://ci.nii.ac.jp/ncid/BA41115197#entity","dc:title":"Semiconductor measurements and instrumentation","cinii:ncid":"BA41115197"}],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Semiconductors","dc:title":"Semiconductors"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA07535225#entity","dc:title":"Texas Instruments electronics series","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:0070542732"}]}]}