Frontiers in electronic testing

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Bibliographic Information

Frontiers in electronic testing

Kluwer Academic Publishers

Other Title

FRET

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Note

Publisher varies: Springer

Related Books： 41-41 of 41
3 / 3
  • IDDQ testing of VLSI circuits

    edited by Ravi K. Gulati and Charles F. Hawkins

    Kluwer Academic Publishers c1993 Frontiers in electronic testing

    Available at 8 libraries

3 / 3
Details
  • NCID
    BA19587827
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    und
  • Place of Publication
    Boston
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