Particle induced x-ray emmission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo. Japan, July 20-24. 1992

書誌事項

Particle induced x-ray emmission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo. Japan, July 20-24. 1992

editor, M. Uda

(Nuclear instruments & methods in physics research, v. B75. Beam interactions with materials and atoms ; section B)

North-Holland, 1993

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注記

Includes bibliographical references and index

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詳細情報

  • NII書誌ID(NCID)
    BA19753915
  • 出版国コード
    ne
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Amsterdam
  • ページ数/冊数
    xix, 603 p.
  • 大きさ
    27 cm
  • 親書誌ID
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