Particle induced x-ray emmission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo. Japan, July 20-24. 1992

Bibliographic Information

Particle induced x-ray emmission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo. Japan, July 20-24. 1992

editor, M. Uda

(Nuclear instruments & methods in physics research, v. B75. Beam interactions with materials and atoms ; section B)

North-Holland, 1993

Available at  / 2 libraries

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Note

Includes bibliographical references and index

Related Books: 1-1 of 1

Details

  • NCID
    BA19753915
  • Country Code
    ne
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Amsterdam
  • Pages/Volumes
    xix, 603 p.
  • Size
    27 cm
  • Parent Bibliography ID
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