Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices

著者

• International Symposium on Corrosion and Reliability of Electronic Materials and Devices
• Sinclair, J. D. (James Douglas)
• Electrochemical Society. Corrosion, Electronics, and Dielectric Science and Technology Divisions

書誌事項

Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices

edited by R. B. Comizzoli, J.D. Sinclair ; assistant editors, R.P. Frankenthal [et al.]

（Proceedings / [Electrochemical Society], v. 93-1）

Electrochemical Society, c1993

タイトル別名

Corrosion and Reliability of electronic materials and devices

注記

Symposium held in Toronto, Ontario, Canada , Oct. 11-16, 1992

詳細情報

• NII書誌ID(NCID): BA19785911
• ISBN:
  • 1566770513
• LCCN: 92074540
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: xi, 604 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TK7871
  • DC20 : 621.381
• 件名:
  • LCSH : Electronics -- Materials -- Corrosion -- Congresses
  • LCSH : Electronic apparatus and appliances -- Corrosion -- Congresses
• 親書誌ID:
  • BA01323290