X-ray optics and microanalysis 1992 : proceedings of the thirteenth International Congress, UMIST, Manchester, UK, 31 August-4 September 1992
著者
書誌事項
X-ray optics and microanalysis 1992 : proceedings of the thirteenth International Congress, UMIST, Manchester, UK, 31 August-4 September 1992
(Institute of Physics conference series, no. 130)
Institute of Physics, c1993
- タイトル別名
-
13 ICXOM 92
大学図書館所蔵 全10件
  青森
  岩手
  宮城
  秋田
  山形
  福島
  茨城
  栃木
  群馬
  埼玉
  千葉
  東京
  神奈川
  新潟
  富山
  石川
  福井
  山梨
  長野
  岐阜
  静岡
  愛知
  三重
  滋賀
  京都
  大阪
  兵庫
  奈良
  和歌山
  鳥取
  島根
  岡山
  広島
  山口
  徳島
  香川
  愛媛
  高知
  福岡
  佐賀
  長崎
  熊本
  大分
  宮崎
  鹿児島
  沖縄
  韓国
  中国
  タイ
  イギリス
  ドイツ
  スイス
  フランス
  ベルギー
  オランダ
  スウェーデン
  ノルウェー
  アメリカ
注記
Includes bibliographical references and index
内容説明・目次
内容説明
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
目次
- Cosslett symposium: (speakers T Mulvey, W C Nixon, R W Horne, A Glauert, J V Long, P Duncumb, A Boyde, P W Hawkes). Invited papers: Recent advances in electron microprobe analysis (S J B Reed)
- Database and review of quantitative EMPA procedures (K F J Heinrich)
- Atomic resolution incoherent imaging and analysis with the STEM (S J Pennycook et al)
- The quantitative analysis of thin specimens (D B Williams)
- Imaging surfaces with scanning tunnelling and scanning force microscopes (H-J Butt)
- Aspects of 3-D imaging, display and measurement in light and scanning electron microscopy (A Boyde)
- Developments in image processing (P W Hawkes). Never mind the baby, how about the bath water?: insights from the secondary electron background in electron spectroscopy (J A D Matthew et al)
- The use of integrated circuits for position-sensitive detection (J Comer et al)
- Surface studies in UHV-SEM and STEM (J A Venables et al)
- Electron spectroscopy at high spatial resolution (P Kruit)
- The performance of the photoelectron spectromicroscope at low and high energies (D W Turner and I R Plummer)
- Laser-plasma XUV sources, advances in performance (F Bijkerk)
- X-ray microprobes based on Bragg-Fresnel crystal optics for high energy X-rays (V V Aristov et al)
- X-ray holography at the National Synchrotron Ligh Source (C Jacobsen et al)
- Review on the development of cone-beam X-ray microtomography (P C Cheng et al)
- The opportunities and challenges of using high brilliance X-ray synchotron sources (P Pattison)
- Present status of and future prospects for synchotron-based microtechniques that utilize X-ray fluorescence, absorption spectroscopy, diffraction and tomography (J V Smith)
- Properties and applications of soft x-ray undulators in structural and microstructural studies of the surfaces of materials (D P Woodruff)
- Review of EPMA and future developments (K F J Heinrich).
「Nielsen BookData」 より