Scanning electron microscopy/1973 : proceedings of the Part 1 (April 24,25, 1973) 6th Annual Scanning Electron Microscopy Symposium, Part 2 (April 23, 1973) Electron specimen interactions: theory for scanning electron microscopy, Part 3 (April 25 to 27, 1973) Scanning electron microscopy in pathology

著者

• International Symposium on Scanning Electron Microscopy
• Johari, Om
• Corvin, Irene
• IIT Research Institute

書誌事項

Scanning electron microscopy/1973 : proceedings of the Part 1 (April 24,25, 1973) 6th Annual Scanning Electron Microscopy Symposium, Part 2 (April 23, 1973) Electron specimen interactions: theory for scanning electron microscopy, Part 3 (April 25 to 27, 1973) Scanning electron microscopy in pathology

edited by Om Johari and Irene Corvin

IIT Research Institute, [1973?]

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA19936595
• LCCN: 72626068
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chicago, Ill.
• ページ数/冊数: xv, 789 p.
• 大きさ: 29 cm
• 分類:
  • LCC : QH212.S3
  • DC : 578/.4/5
• 件名:
  • LCSH : Scanning electron microscope -- Congresses