Chaos and stability in defect processes in semiconductors

Author(s)

Bibliographic Information

Chaos and stability in defect processes in semiconductors

editors, I.V. Verner, N.N. Gerasimenko, J.W. Corbett

Trans Tech Publications, c1993

Available at  / 1 libraries

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Note

"Defect and diffusion forum vol. 90"--T.p.

Details

  • NCID
    BA19997002
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Aedermannsdorf, Switzerland
  • Pages/Volumes
    vi, 203 p.
  • Size
    25 cm
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