Reliability and life testing handbook

著者

書誌事項

Reliability and life testing handbook

Dimitri Kececioglu

PTR Prentice Hall, c1993-c1994

  • v. 1
  • v. 2

タイトル別名

Reliability & life testing handbook

大学図書館所蔵 件 / 全8件

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注記

Cover title: Reliability & life testing handbook

Includes bibliographical references and index

内容説明・目次

巻冊次

v. 2 ISBN 9780137723690

内容説明

The second volume in this comprehensive two-volume series provides information, procedures, tests and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Volume II includes up-to-date information on Accept-Reject tests, the Sequential Probability Radio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as some very important accelerated tests including Arrhenius, Eyriing, Bazovsky, Inverse Power Law and many others. It also offers sections on reliability growth monitoring techniques and property testing methods for establishing MTBF or reliability with the desired accuracy and confidence level.

目次

  • Non-parametric testing
  • accept-reject testing with fixed test time and fixed test failures while meeting both the consumer's and the producer's risk requirements for the exponential case
  • sequential probability ration test (SPRT) for the exponential case
  • sequential test on the scale parameter for the Weibull case
  • accept-reject testing for the binomial case
  • sequential testing for the binomial case
  • Bayesian reliability demonstration
  • accelerated life testing and reliability demonstration
  • test sample size determination
  • reliability and maintainability books
  • other literature, data sources
  • government specifications and standards and sources of computer programs.
巻冊次

v. 1 ISBN 9780137723775

内容説明

This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series.

目次

  • Objectives, types, scheduling, and management, reliability data - its acquisitions and processing
  • five very important and fundamental reliability engineering relationships and the failure rate concept
  • distribution, failure rate and reliability determination from field data
  • the Chi-square distribution
  • the exponential distribution
  • confidence interval on the mean life of normally distributed data
  • life range, life limit and lower one-sided confidence limits on the reliability with normally distributed data
  • the lognormal distribution
  • the Weibull distribution
  • confidence limits on the reliabiity with Weibull distributed times to failure
  • ranks not yet available in the tables
  • tests of comparison for the Weibull distribution
  • the gamma distribution
  • the beta distribution
  • methods of parameter distribution
  • Chi-squared goodness-of-Fit test
  • step-by-step method for goodness-of-fit analysis
  • reliability and confidence limits for one-shot items or binomial (Bernoulli) trials
  • comparing two lots through binomial testing
  • suspended-items testing and analysis of field and warranty data
  • sudden-death testing.

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