Stereology and morphometry in electron microscopy : problems and solutions

Author(s)

• Reith, Albrecht
• Mayhew, Terry M.

Bibliographic Information

Stereology and morphometry in electron microscopy : problems and solutions

edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Ewald R. Weibel

（An Ultrastructural pathology publication series）

Hemisphere Pub. Corp., c1988

Note

Bibliography: p. 211-212

Includes index

Details

• NCID: BA20314424
• ISBN:
  • 0891166238
• LCCN: 87035365
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xix, 215 p.
• Size: 24 cm
• Classification:
  • LCC : RB43.5
  • DC19 : 616.07/58
• Subject Headings:
  • LCSH : Electron microscopy -- Technique
  • LCSH : Stereology
• Parent Bibliography ID:
  • BA07345999