Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers

Bibliographic Information

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society Press, 1992

• : microfiche
• : hard

Other Title

ATS '92 Proceedings

Note

"IEEE Computer Society Press order number 2985."

"IEEE Catalog Number 92TH0458-0"

Includes bibliographies and index

Details

• NCID: BA20318312
• ISBN:
  • 0818629851
  • 081862986X
  • 0818629878
• LCCN: 92071801
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, CA
• Pages/Volumes: x, 259 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses