Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers

書誌事項

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society Press, 1992

• : microfiche
• : hard

タイトル別名

ATS '92 Proceedings

注記

"IEEE Computer Society Press order number 2985."

"IEEE Catalog Number 92TH0458-0"

Includes bibliographies and index

内容説明・目次

内容説明

Seventy-three contributors from 12 countries in Asia, Europe, and North America demonstrate a strong interest in the field of test and design technologies. Discussions include fault simulation, one-line testing, diagnostics, and testability techniques. The symposium was held in Hiroshima, Japan, Nov

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA20318312
• ISBN:
  • 0818629851
  • 081862986X
  • 0818629878
• LCCN: 92071801
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA
• ページ数/冊数: x, 259 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses