Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

Author(s)

• Passaglia, Elio
• Stromberg, R. R.
• Kruger, J.

Bibliographic Information

Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

edited by E. Passaglia, R.R. Stromberg and J. Kruger

（National Bureau of Standards miscellaneous publication, 256）

[For sale by the Superintendent of Documents, U.S. Government Printing Office], 1964

Note

At head of title: United States Separtment of Commerce. National Bureau of Standards

Includes bibliographical references and index

Details

• NCID: BA20408776
• LCCN: 64060043
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Washington, D.C.]
• Pages/Volumes: v, 359 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA19273068