Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

著者

• Passaglia, Elio
• Stromberg, R. R.
• Kruger, J.

書誌事項

Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

edited by E. Passaglia, R.R. Stromberg and J. Kruger

（National Bureau of Standards miscellaneous publication, 256）

[For sale by the Superintendent of Documents, U.S. Government Printing Office], 1964

注記

At head of title: United States Separtment of Commerce. National Bureau of Standards

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA20408776
• LCCN: 64060043
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Washington, D.C.]
• ページ数/冊数: v, 359 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA19273068