Integrated circuit defect-sensitivity : theory and computational models

著者

• Pineda de Gyvez, José

書誌事項

Integrated circuit defect-sensitivity : theory and computational models

by José Pineda de Gyvez

（The Kluwer international series in engineering and computer science, SECS 208 . Microelectronics manufacturing）

Kluwer Academic Publishers, c1993

注記

Includes bibliographical references (p. 138-146) and index

詳細情報

• NII書誌ID(NCID): BA20492885
• ISBN:
  • 0792393066
• LCCN: 92035547
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xxiv, 167 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Data processing
  • LCSH : Integrated circuits -- Very large scale integration -- Defects -- Mathematical models
  • LCSH : Computer-aided design
• 親書誌ID:
  • BA0004729X