Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

書誌事項

Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

James R. Ehrstein, editor

(ASTM special technical publication, 572)(NBS special publication, 400-10)

U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974

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Spreading resistance symposium

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注記

"Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."

Bibliography: p. 279-281

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