X-ray diffraction at elevated temperatures : a method for in situ process analysis

Author(s)

• Chung, Deborah D. L.

Bibliographic Information

X-ray diffraction at elevated temperatures : a method for in situ process analysis

D.D.L. Chung ... [et al.]

VCH, c1993

Note

Includes bibliographical references and index

Details

• NCID: BA20536040
• ISBN:
  • 0895737450
  • 3527278427
• LCCN: 92021803
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: viii, 268 p.
• Size: 24 cm
• Classification:
  • LCC : QC482.D5
  • DC20 : 548/.83
• Subject Headings:
  • LCSH : X-rays -- Diffraction
  • LCSH : X-rays -- Industrial applications