Symposium on advances in electron metallography and electron probe microanalysis : held at Atlantic City, N.J., June 28, 1960, and June 26, 1961

Author(s)

• Symposium on Advances in Electron Metallography
• American Society for Testing and Materials. Committee E-4 on Metallography

Bibliographic Information

Symposium on advances in electron metallography and electron probe microanalysis : held at Atlantic City, N.J., June 28, 1960, and June 26, 1961

sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography

（ASTM special technical publication, no. 317）

ASTM, 1962

Note

This is v.3 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

Details

• NCID: BA20544253
• LCCN: 62018223
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Philadelphia, Pa.
• Pages/Volumes: v, 207 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA00068096