Advances in electron metallography, vol. 6 : a symposium presented at the Sixty-eighth Annual Meeting, American Society for Testing and Materials, Lafayette, Ind., June 13-18, 1965

著者

• Symposium on Advances in electron Metallography
• American Society for Testing and Materials. Committee E-4 on Metallography

書誌事項

Advances in electron metallography, vol. 6 : a symposium presented at the Sixty-eighth Annual Meeting, American Society for Testing and Materials, Lafayette, Ind., June 13-18, 1965

（ASTM special technical publication, no. 396）

ASTM, 1966

注記

"sponsored by Subcommittee XI (Electron Microscopy, Diffraction, and Microprobe Analysis) of Committee E-4 on Metallography."

詳細情報

• NII書誌ID(NCID): BA20544548
• LCCN: 59008773
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia, Pa.
• ページ数/冊数: 131 p.
• 大きさ: 23 cm
• 親書誌ID:
  • BA00068096