ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain

sponsored by the IEEE Electron Devices Society

IEEE Service Center, c1992

• : soft.
• : case.
• : micro.

タイトル別名

1993 IEEE International Conference on Microelectronic Test Structures

93CH32201

注記

Includes bibliographical references and index

"93CH3220-1."

詳細情報

• NII書誌ID(NCID): BA20547003
• ISBN:
  • 0780308573
  • 0780308581
  • 078030537X
• LCCN: 92056792
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: xv, 298 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses