ISTFA '91 : proceedings of the 17th International Symposium for Testing & Failure Analysis

著者

• International Symposium for Testing and Failure Analysis
• ASM International. Electronic Materials and Processing Division

書誌事項

ISTFA '91 : proceedings of the 17th International Symposium for Testing & Failure Analysis

sponsored by the Electronic Materials and Processing Division of ASM International

ASM International, c1991

タイトル別名

ASM International Conference Proceedings

注記

Conference held Los Angeles, Calif., Nov. 11-15, 1991

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA20559567
• ISBN:
  • 0871704366
• LCCN: 91076884
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: und
• 出版地: Materials Park, Ohio
• ページ数/冊数: xi, 565 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871
  • DC20 : 621.381
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses