Speckle metrology

著者

• Sirohi, Rajpal S.

書誌事項

Speckle metrology

edited by Rajpal S. Sirohi

（Optical engineering, v. 38）

Marcel Dekker Inc., c1993

内容説明・目次

内容説明

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

目次

• Theory and applications of speckle displacement and decorrelation, I. Yamaguchi
• techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi
• speckle methods in experimental mechanics, Rajpal S. Sirohi
• recent developments in video speckle interferometry, Ole J. Lokberg
• novel applications of speckle metrology, Chandra S. Vikram
• particle image velocimetry (PIV), K.D. Hinsch
• white light speckle metrology, Anand K. Asundi
• surface roughness evaluation, J.D. Briers
• automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann
• speckle metrology using hololenses, Chandra Shahker
• correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.

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詳細情報

• NII書誌ID(NCID): BA20564159
• ISBN:
  • 0824789326
• LCCN: 93000734
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xiii, 551 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.2
  • DC20 : 620.1/127
• 件名:
  • LCSH : Non-destructive testing
  • LCSH : Speckle metrology
• 親書誌ID:
  • BA00339477