Speckle metrology

Author(s)

• Sirohi, Rajpal S.

Bibliographic Information

Speckle metrology

edited by Rajpal S. Sirohi

（Optical engineering, v. 38）

Marcel Dekker Inc., c1993

Details

• NCID: BA20564159
• ISBN:
  • 0824789326
• LCCN: 93000734
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xiii, 551 p.
• Size: 24 cm
• Classification:
  • LCC : TA417.2
  • DC20 : 620.1/127
• Subject Headings:
  • LCSH : Non-destructive testing
  • LCSH : Speckle metrology
• Parent Bibliography ID:
  • BA00339477