Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

著者

• Biegelsen, D. K.
• Smith, David J.
• Tong, S. Y.

書誌事項

Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

editors, David K. Biegelsen, David J. Smith, S.Y. Tong

（Materials Research Society symposium proceedings, v. 295）

Materials Research Society, 1993

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA20587802
• ISBN:
  • 1558991905
• LCCN: 93015224
• 出版国コード: us
• タイトル言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: ix, 288 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA418.7
  • DC20 : 620/.44
• 件名:
  • LCSH : Surfaces (Technology) -- Congresses
  • LCSH : Scanning electron microscopy -- Congresses
  • LCSH : Atomic structure -- Congresses
• 親書誌ID:
  • BA00013775