Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

Author(s)

• Biegelsen, D. K.
• Smith, David J.
• Tong, S. Y.

Bibliographic Information

Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

editors, David K. Biegelsen, David J. Smith, S.Y. Tong

（Materials Research Society symposium proceedings, v. 295）

Materials Research Society, 1993

Note

Includes bibliographical references and index

Details

• NCID: BA20587802
• ISBN:
  • 1558991905
• LCCN: 93015224
• Country Code: us
• Title Language Code: eng
• Text Language Code: und
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: ix, 288 p.
• Size: 24 cm
• Classification:
  • LCC : TA418.7
  • DC20 : 620/.44
• Subject Headings:
  • LCSH : Surfaces (Technology) -- Congresses
  • LCSH : Scanning electron microscopy -- Congresses
  • LCSH : Atomic structure -- Congresses
• Parent Bibliography ID:
  • BA00013775