Scanning electron microscopy and x-ray microanalysis
著者
書誌事項
Scanning electron microscopy and x-ray microanalysis
（Analytical chemistry by open learning）
Wiley, c1987
- : pbk.
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内容説明・目次
内容説明
Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis. Mathematics are kept to a minimum with the emphasis on developing an understanding of the practical aspects of the techniques. The use of self-assessment questions to reinforce the learning process is particularly valuable.
目次
- SEM-Instrumentation: Introduction
- Principles of Operation
- Specimen/Electron Interactions
- Detectors
- Operating Conditions and Limitations
- Specimen Preparation: Specimen Characteristics
- Drying Techniques
- Coating
- Cryo-SEM
- SEM X-Ray Microanalysis-Instrumentation: Introduction
- X-Ray Production in the SEM
- Wavelength Dispersive Systems (WDS)
- Energy Dispersive Systems (EDX)
- Operating Conditions and Limitations
- Data Handling
- Other Surface Analytical Techniques.
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