ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings

著者

• European Test Conference
• IEEE Computer Society
• Convention of National Societies of Electrical Engineers of Western Europe

書誌事項

ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings

sponsored by the IEEE Computer Society in cooperation with EUREL

IEEE Computer Society Press, c1993

• : paper
• : microfiche

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA20852732
• ISBN:
  • 0818633603
  • 0818633611
• LCCN: 92074403
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xvi, 548 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381028/7
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses