ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings

Author(s)

• European Test Conference
• IEEE Computer Society
• Convention of National Societies of Electrical Engineers of Western Europe

Bibliographic Information

ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings

sponsored by the IEEE Computer Society in cooperation with EUREL

IEEE Computer Society Press, c1993

• : paper
• : microfiche

Note

Includes bibliographical references and index

Details

• NCID: BA20852732
• ISBN:
  • 0818633603
  • 0818633611
• LCCN: 92074403
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xvi, 548 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381028/7
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses